The single-stuck fault model (SSFM) assumes that a fault directly affects only one node and that the node is stuck at either 0 or 1. These assumptions make test pattern generation easier, but the validity of the model is questionable. Multiple faults do occur, and multiple faults can theoretically mask each other. On the other hand, the model appears to be valid most of the time. Hence, almost all test pattern generation relies on this model. Multiple faults are generally found with test patterns for single faults.
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- owner: wom - (no access) - Digital system design with SystemVerilog.pdf, p233
- owner: wom - (no access) - Digital system design with SystemVerilog.pdf, p233
- owner: wom - (no access) - Digital system design with SystemVerilog.pdf, p264
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